Article

Transport Properties of Over-doped Epitaxial NdCeCuO Films

Physics Department E.R. Caianiello, Università di Salerno, Via Ponte don Melillo, 84084 Fisciano, SA, Italy; Centro Interdipartimentale TEDASS, Universitá del Sannio, 82100 Benevento, Italy; Dipartimento di Scienze Biologiche ed Ambientali, Universitá del Sannio, Via Port’Arsa 11, 82100 Benevento, Italy
Journal of Superconductivity and Novel Magnetism (impact factor: 0.65). 04/2012; 24(1):169-172. DOI:10.1007/s10948-010-0913-7 pp.169-172

ABSTRACT The transport properties of slightly overdoped Nd2−x
Ce
x
CuO4−δ
(NCCO) c-axis oriented thin films with x=0.17 have been investigated in the temperature range from 2.5K to 300K and in magnetic fields up to 6 T applied perpendicular
to the CuO2 planes. The films have been grown by a dc sputtering technique in on-axis configuration. They have been optimized on (001)-oriented
SrTiO3 substrates and successively annealed in pure Argon at 900 °C. Structural and compositional analyses were carried out by means
of X-ray diffraction and scanning electron microscopy equipped with a wavelength dispersive spectroscopy detector. Current-voltage
characteristics of the NCCO films have been measured and the temperature and the magnetic field dependence of the critical
current density J
c(T,H) has been obtained. Finally, an increase of the low-temperature normal state resistance with the field has also been observed.

KeywordsElectrical properties of thin film–Superconducting film–Cuprate superconductors

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Keywords

CuO2 planes
 
films
 
KeywordsElectrical properties
 
low-temperature normal state resistance
 
magnetic field dependence
 
magnetic fields
 
NCCO films
 
on-axis configuration
 
scanning electron microscopy
 
temperature range
 
thin films
 
thin film–Superconducting film–Cuprate superconductors
 
transport properties
 
wavelength dispersive spectroscopy detector
 
X-ray diffraction