Conference Proceeding

CNN Implementation of Spin Filters for Electronic Speckle Pattern Interferometry Applications

Dept. of Electron. & Comput. Sci., Santiago de Compostela Univ.
06/2007; DOI:10.1109/ISCAS.2007.377964 pp.2674 - 2677 In proceeding of: Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Source: IEEE Xplore

ABSTRACT Electronic speckle pattern interferometry (ESPI) is a well-known technique in the realm of optoelectronics by which a fringe pattern is formed when two coherent light beams (typically lasers) interfere after, at least one of them, is reflected off a rough surface. The resultant image is acquired by electronic means, with either a CCD camera or CMOS imagers. Observation of the fringe pattern gives information about a measurement. Examples of such measurements are displacement of an object, surface deformation, vibration, velocity, etc. Image analysis is required to read and interpret the underlying information conveyed in the fringe pattern. This paper merges ESPI with cellular non-linear networks (CNN). The final goal is to run ESPI image processing on CMOS CNN-based chips to cover applications with hard time requirements. The current work addresses the first stage which is noise removal through spin filters with CNN operators.

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Keywords

CCD camera
 
cellular non-linear networks
 
CMOS CNN-based chips
 
CNN
 
CNN operators
 
current work addresses
 
electronic
 
Electronic speckle pattern interferometry
 
ESPI image processing
 
Examples
 
first stage
 
fringe pattern
 
optoelectronics
 
paper merges ESPI
 
resultant image
 
rough surface
 
surface deformation
 
time requirements
 
underlying information
 
well-known technique