Article

In-situ RHEED studies of YBCO-film growth during pulsed laser deposition

Inst. fur Physik, Augsburg Univ.
IEEE Transactions on Appiled Superconductivity (impact factor: 1.04). 04/1993; DOI:10.1109/77.233897 pp.1594 - 1597
Source: IEEE Xplore

ABSTRACT In-situ reflection high-energy electron diffraction (RHEED)
measurements during laser ablation of
YBa2Cu3O7-x (YBCO) on
SrTiO3(100), (305) and on SrTiO3(100) misoriented
2° and 3° towards (110) were performed. The specularly reflected
electron intensity oscillation is modulated by the laser pulse
deposition frequency. The crystallization of the deposited material is
directly monitored by an exponential intensity rise of the specular
intensity. From the time constant the critical laser repetition
frequency can be estimated. Oscillations were not observed during the
growth on 3° vicinal SrTiO3(100) and on
SrTiO3(305) substrates. For these substrates well-aligned
steps parallel to the [100] direction exist due to growth by step
movement. From this a mean diffusion length between 7.5 nm and 11 nm at
720°C was determined

0 0
 · 
0 Bookmarks
 · 
12 Views
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed. The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual current impact factor. Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence agreement may be applicable.

Keywords

deposited material
 
electron intensity oscillation
 
exponential intensity rise
 
In-situ reflection high-energy electron diffraction
 
mean diffusion length
 
Oscillations
 
specularly
 
time constant
 
YBCO
 

H. Karl