Conference Proceeding

Robust Statistical Multi-line TRL Calibration Approach for Microwave Device Characterization

Departamento de Ingenieria de Comunicaciones, Universidad de Malaga
06/2006; DOI:10.1109/MELCON.2006.1653068 pp.187 - 190 In proceeding of: Electrotechnical Conference, 2006. MELECON 2006. IEEE Mediterranean
Source: IEEE Xplore

ABSTRACT This communication shows the features and comparisons of several robust statistical techniques applied to enhance the TRL calibration algorithm for S-parameters measurements using vector network analyzers. The use of several lines allows the reduction of the noise in the measurements and an appreciable increase in the frequency bandwidth of the TRL application. The Huber estimator is proposed to enhance the reduction of the random errors effects in the calibration process. Simulation and experimental measurements has been carried out to assess the validity of the proposed methodology

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Keywords

appreciable increase
 
features
 
frequency bandwidth
 
Huber estimator
 
proposed methodology
 
random errors effects
 
robust statistical techniques
 
TRL calibration algorithm
 
vector network analyzers