Article

Free-space-wiring fabrication in nano-space by focused-ion-beam chemical vapor deposition

Himeji Institute of Technology, Graduate School of Science, LASTI, 3-1-2 Koto, Kamigori, Ako, Hyogo 678-1205, JapanCREST JST, Japan Science and Technology Co., Kawaguchi Center Building, 4-1-8, Hon-cho, Kawaguchi, Saitama 332-0012, Japan
Journal of vacuum science & technology. B, Microelectronics and nanometer structures: processing, measurement, and phenomena: an official journal of the American Vacuum Society (impact factor: 1.34). 12/2003; DOI:10.1116/1.1630329 pp.2737 - 2741
Source: IEEE Xplore

ABSTRACT Focused-ion-beam chemical vapor deposition (FIB-CVD) is an excellent technology for forming three-dimensional nanostructures. Various diamond-like-carbon (DLC) free-space-wirings have been demonstrated by FIB-CVD using a computer-controlled pattern generator, which is a commercially available pattern generator for electron-beam (EB) lithography. The material composition and crystal structure of DLC free-space-wiring were studied by transmission-electron microscopy and energy-dispersive x-ray spectroscopy. As a result, it became clear that DLC free-space-wiring is amorphous carbon containing a Ga core in the wire. Furthermore, the electrical resistivity measurement of DLC free-space-wiring was carried out by two terminal electrodes. Au electrodes were fabricated by EB lithography and a lift-off process. The electrical resistivity was about 100 Ω cm at room temperature. © 2003 American Vacuum Society.

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Keywords

Au electrodes
 
commercially available pattern generator
 
DLC
 
DLC free-space-wiring
 
excellent technology
 
Focused-ion-beam chemical vapor deposition
 
material composition
 
room temperature
 
three-dimensional nanostructures
 
transmission-electron microscopy
 
Various diamond-like-carbon
 
© 2003 American Vacuum Society
 

Takahiko Morita