Article

Combined optical and force microscopy of patterned magnetic films

Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany
Journal of Applied Physics (impact factor: 2.17). 05/2006; DOI:10.1063/1.2172538 pp.08S504 - 08S504-3
Source: IEEE Xplore

ABSTRACT Combined magneto-optic indicator film (MOIF) and magnetic force microscopy (MFM) is introduced as an advanced tool for the characterization of patterned ferromagnetic films. The MOIF technique combines quantitative stray field imaging of individual micron-sized magnetic elements with a large-area overview of the patterned film while MFM provides nanometer spatial resolution. In order to demonstrate the potential of this approach, lithographically patterned CoPt films with out-of-plane anisotropy were characterized. The large-scale MOIF images reveal variations of the magnetization state and the magnetization reversal among individual magnetic elements. Corresponding high-resolution MFM images relate these results to the micromagnetic configuration of the elements.

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Keywords

advanced tool
 
CoPt films
 
ferromagnetic films
 
high-resolution MFM images
 
individual micron-sized magnetic elements
 
large-area overview
 
magnetic force microscopy
 
magneto-optic indicator film
 
MFM
 
micromagnetic configuration
 
MOIF technique
 
nanometer spatial resolution
 
out-of-plane anisotropy
 
patterned film
 

S. Sievers