Design and Calibration of Electric Field Probe to the Frequency Range of 2 to 3 GHz

INPI, Rio de Janeiro
IEEE Latin America Transactions (Impact Factor: 0.19). 01/2009; DOI: 10.1109/TLA.2008.4917425
Source: IEEE Xplore

ABSTRACT Two probes designed for electric field measurements were constructed by two semi-rigid coaxial cables, through a non-expensive simple handmade process. Both probes were also simulated by a program specifically used for microwave devices and calibrated following international standards for the frequency range of 2 to 3 GHz. The simulations and the calibration procedure, which was performed in a semi-anechoic chamber, evaluated the measured voltage, performance factor and S11 of each probe. The simulated and experimental results were compared. The return loss parameter was used to determine the maximum operation frequency. The results showed that even simple probes as the ones constructed in the present work, when properly calibrated, can be used to measure with good accuracy the magnitude of the electric field in the considered frequency range.

  • Source
    [Show abstract] [Hide abstract]
    ABSTRACT: Based upon the standard IEEE 1309, a new calibration method for electromagnetic (EM) probes is proposed. The aforementioned method compares the electric field strength measured with the EM probe subject to calibration with the E-field intensity calculated through a linear interpolation of the corrected measurement using a reference EM probe. The corrected measurement results are computed by means of the calibration factors stated in the calibration certificate of the reference EM probe. The conditions and criteria under which it is possible to calibrate EM probes inside semi-anechoic chambers in the frequency range of 80 MHz to 1 GHz, are presented. The results shows that the calibration method proposed in this paper is characterized by deviations of less than 1 dB in almost all the frequencies considered, verifying the reliability of the method. The proposed approach is very useful for registering the measurement drift of EM probes used in EMC testing laboratories.
    Progress In Electromagnetics Research B 03/2012; 39:355-371. DOI:10.2528/PIERB12012604