ZnTe:O phosphor development for x-ray imaging applications

Phosphor Technology Center of Excellence, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245
Applied Physics Letters (Impact Factor: 3.79). 04/2006; DOI: 10.1063/1.2185427
Source: IEEE Xplore

ABSTRACT An efficient ZnTe : O x-ray powder phosphor was prepared by a dry synthesis process using gaseous doping and etching medias. The x-ray luminescent properties were evaluated and compared to standard commercial phosphors exhibited an x-ray luminescent efficiency equivalent to 76% of Gd 2 O 2 S : Tb and an equal resolution of 2.5 lines / mm . In addition, the fast decay time, low afterglow, and superior spectral match to conventional charge-coupled devices-indicate that ZnTe : O is a very promising phosphor candidate for x-ray imaging applications.

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    ABSTRACT: We report on a novel approach to produce oxygen-doped zinc telluride (ZnTe:O), a remarkable group II-VI semiconductor scintillator, fabricated in the columnar-structured or polycrystalline forms needed to fulfill the needs of many demanding X-ray and -ray imaging applications. ZnTe:O has one of the highest conversion efficiencies among known scintillators, emission around 680 nm (which is ideally suited for CCD sensors), high density of 6.4 g/cm<sup>3</sup>, fast decay time of ~1μs with negligible afterglow, and orders of magnitude higher radiation resistance compared to commonly used scintillators. These properties allow the use of ZnTe:O in numerous applications, including X-ray imaging, nuclear medicine (particularly SPECT), room temperature radioisotope identification, and homeland security. Additionally, ZnTe:O offers distinct advantages for synchrotron-based high resolution imaging due to the absence of atomic absorption edges in the low energy range, which otherwise reduce resolution due to secondary X-ray formations. We have fabricated films of ZnTe:O using a vapor deposition technique that allows large-area structured scintillator fabrication in a time- and cost-efficient manner, and evaluated its performance for small-angle X-ray scattering (SAXS) at an Argonne National Laboratory synchrotron beamline. Details of the fabrication and characterization of the optical, scintillation and imaging properties of the ZnTe:O films are presented in this paper.
    IEEE Transactions on Nuclear Science 07/2010; · 1.22 Impact Factor


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