Article
Deep-Submicrometer AlGaN/GaN HEMTs With Slant Field Plates
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA
IEEE Electron Device Letters (impact factor:
2.85).
05/2009;
DOI:10.1109/LED.2009.2014790
pp.328 - 330
Source: IEEE Xplore
-
Citations (0)
-
Cited In (0)
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed.
The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual
current impact factor.
Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence
agreement may be applicable.
Keywords
drain bias
excellent millimeter-wave power density
minimize
parasitic capacitance
power-added efficiency
Prototype device results
slant field plates