Conference Proceeding

Using Imputation Techniques to Help Learn Accurate Classifiers

Comput. Sci. & Eng., Florida Atlantic Univ., Boca Raton, FL
12/2008; DOI:10.1109/ICTAI.2008.60 pp.437 - 444 In proceeding of: Tools with Artificial Intelligence, 2008. ICTAI '08. 20th IEEE International Conference on, Volume: 1
Source: IEEE Xplore

ABSTRACT It is difficult to learn good classifiers when training data is missing attribute values. Conventional techniques for dealing with such omissions, such as mean imputation, generally do not significantly improve the performance of the resulting classifier. We proposed imputation-helped classifiers, which use accurate imputation techniques, such as Bayesian multiple imputation (BMI), predictive mean matching (PMM), and Expectation Maximization (EM), as preprocessors for conventional machine learning algorithms. Our empirical results show that EM-helped and BMI-helped classifiers work effectively when the data is "missing completely at random", generally improving predictive performance over most of the original machine learned classifiers we investigated.

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Keywords

algorithms
 
Bayesian multiple imputation
 
EM-helped
 
Expectation Maximization
 
good classifiers
 
omissions
 
PMM
 
predictive
 
predictive performance
 
preprocessors
 
resulting classifier
 
training data
 
use accurate imputation techniques