Conference Paper

Linewidth Enhancement Factor of Semiconductor Lasers: Results from Round-Robin Measurements in COST 288 Action

Univ. of Zaragoza, Cuarte
DOI: 10.1109/CLEO.2007.4452795 Conference: Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Source: IEEE Xplore

ABSTRACT Round-robin measurements on the linewidth enhancement factor are carried out within several laboratories participating to EU COST 288 action. The alpha-factor is measured by applying up to 7 different techniques. The obtained results are compared.

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Available from: J. Rorison, Sep 26, 2015
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    • "Experimentally, various techniques have been proposed for the measurement of the LEF [51], [53]. In this work, we employ the widely used FM/AM technique for extracting the above-threshold LEF, while the ASE method is used for obtaining the below-threshold one. "
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    • "The α-factor measurement technique developed by Hakki-Paoli [2] and its variants have been traditionally used to characterize materials for multiple longitudinal mode lasers, as it is based entirely on simple optical spectral measurements. However, the results obtained with this method have consistently shown a considerable disagreement with the behaviour of final single longitudinal-mode devices [3]. "
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    • "Using disclosed transmitter data [10], a realistic estimation is m =3. In our calculation we use a typical value of C =-3,6 [11]. We suppose that the chirp parameter is independent of the modulation frequency and the intensity [12]. "
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