A new cycle test system emulating inductive switching waveforms
ABSTRACT Cycle life testing of smart power switches requires significant hardware effort to provide the required ohmic-inductive load patterns. A new reliability test system for research purposes is therefore introduced that generates arbitrary current waveforms to emulate inductive switching behavior. This allows flexible cycle stress testing of integrated power switches under arbitrary application conditions. The current drivers of the proposed "ARCTIS" test system are protected from thermal overload in case of failure of a stressed device using a combination of case temperature sensing and a thermal equivalent circuit. Therefore the power MOSFETs in the output stage may be utilized to the limits of their dynamical safe operating area. All devices under test are continuously monitored for short circuit and open load failures. The respective waveforms and failure events are digitally recorded by the PXI-based control system to obtain a statistical basis for the evaluation of cycle life time.
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ABSTRACT: The problem of contemporary semiconductor reliability testing is twofold: on one hand demands on the device lifetime increase steadily implying longer testing times and on the other hand resources are limited (devices, testing time, ...). Therefore it seems unavoidable to apply advanced statistical methods to gain a reliable lifetime model. To increase the model quality significantly, we propose a combination of optimal Design of Experiments (DoE) and Bayesian statistical modeling. Optimal DoE ensures that the data for the model contain as much information as possible, whereas Bayesian modeling provides the possibility to include available prior information. With this approach resources can be saved because lifetime testing can be reduced to a necessary minimum.SCo 2013, Milano; 09/2013
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ABSTRACT: References  Bluder, O. and Waukmann, A.: Bayesian lifetime modeling for power semiconductor devices. World Congress on Engineering and Computer Science 2009, pp.826 -831, Newswood Limited, 2009  Diebolt, J. and Robert, Ch. P.: Estimation of finite mixture distributions through Bayesian sampling. approach to model selection in hierarchical mixture-of-experts architectures. Neural Networks, 10(2), pp. 231-241, 1997.
Conference Paper: Distributed power semiconductor stress test & measurement architecture[Show abstract] [Hide abstract]
ABSTRACT: Conventional reliability testing of microelectronic power devices requires dedicated test systems. In order to test a statistically meaningful set of devices, only simplified stress pattern generation through a centralized controller is performed due to cost restrictions. Knowledge about device performance and failure time is commonly obtained by periodically removing the device from the test setup and performing a measurement on a different test hardware. In this paper, we propose a distributed power semiconductor stress test and measurement architecture to overcome limitations of existing test systems. We show that a local smart controller close to the tested device reduces the centralized system complexity by dividing the reliability testing problem into smaller tasks.Industrial Informatics (INDIN), 2013 11th IEEE International Conference on; 01/2013