Conference Paper

# Reliability and Sensitivity Analysis of Embedded Systems with Modular Dynamic Fault Trees

Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu

DOI: 10.1109/TENCON.2005.300968 Conference: TENCON 2005 2005 IEEE Region 10 Source: IEEE Xplore

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**ABSTRACT:**Fault trees provide a graphical and logical framework for analyzing the reliability of systems. A fault tree provides a conceptually simple modeling framework to represent the system-level interactions between component reliabilities. Dynamic fault trees have been shown particularly useful for reliability analysis of embedded computer systems. Dynamic fault trees are a superset of traditional (static) fault trees in that additional gates are used to model sequential behavior. DIFtree [1] is our fault tree methodology for the analysis of dynamic fault trees, effectively combining the best static fault tree solution technique (Binary Decision Diagrams) with Markov solution techniques for dynamic fault trees. DIFtree includes advanced techniques for modeling coverage; coverage modeling has been shown to be critical to the analysis of fault tolerant computer systems. DIFtree is based on a divideand -conquer technique for modularizing the system level fault tree into independent sub-trees; ...12/1999; - [Show abstract] [Hide abstract]

**ABSTRACT:**A module of a fault tree is a subtree whose terminal events do not occur elsewhere in the tree. Modules, which are independent subtrees, can be used to reduce the computational cost of basic operations on fault trees, such as the computation of the probability of the root event or the computation of the minimal cut sets. This paper presents a linear time algorithm to detect modules of a fault tree, coherent or not, that is derived from the Tarjan algorithm to find strongly connected components of a graph. The authors show, on a benchmark of real fault trees, that their method detects modules of trees with several hundred gates and events within few milliseconds on a personal computerIEEE Transactions on Reliability 10/1996; · 1.66 Impact Factor - [Show abstract] [Hide abstract]

**ABSTRACT:**The value of depth-first search or "backtracking" as a technique for solving graph problems is illustrated by two examples. An algorithm for finding the biconnected components of an undirected graph and an improved version of an algorithm for finding the strongly connected components of a directed graph are presented. The space and time requirements of both algorithms are bounded by k1V + k2E + k3 for some constants k1, k2, and k3, where V is the number of vertices and E is the number of edges of the graph being examined.Switching and Automata Theory, 1966., IEEE Conference Record of Seventh Annual Symposium on 11/1971;

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