Conference Proceeding

Robustness analysis of soft error accumulation in SRAM-FPGAs using FLIPPER and STAR/RoRA

Ist. di Astrofis. Spaziale e Fis. Cosmica, Ist. Naz. di Astrofis., Milan, Italy
10/2008; DOI:10.1109/RADECS.2008.5782703 In proceeding of: Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Source: IEEE Xplore

ABSTRACT We describe a methodology for analyzing the robustness of circuits implemented by SRAM-based FPGAs against the accumulation of soft errors within the configuration memory. A detailed analysis of the fault injection data is presented.

0 0
 · 
0 Bookmarks
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed. The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual current impact factor. Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence agreement may be applicable.

Keywords

accumulation
 
circuits
 
configuration memory
 
fault injection data
 
soft errors