Design and Validation of Robust Systems
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA01/2011; DOI:10.1109/ISED.2010.11 In proceeding of: Electronic System Design (ISED), 2010 International Symposium on
Source: IEEE Xplore
ABSTRACT Robust system design ensures that future electronic systems perform correctly despite increasing complexity and rising levels of disturbances in the underlying hardware. This paper discusses two essential aspects of robust system design.
Conference Proceeding: Combinational Logic Soft Error Correction[show abstract] [hide abstract]
ABSTRACT: We present two techniques for correcting radiation-induced soft errors in combinational logic - error correction using duplication, and error correction using time-shifted outputs. Simulation results show that both techniques reduce combinational logic soft error rate by more than an order of magnitude. Soft errors affecting sequential elements (latches and flip-flops) at combinational logic outputs are automatically corrected using these techniquesTest Conference, 2006. ITC '06. IEEE International; 11/2006
Conference Proceeding: Cross-layer resilience challenges: Metrics and optimization.[show abstract] [hide abstract]
ABSTRACT: With increasing sources of disturbances in the underlying hardware, a key challenge in design of robust systems is to meet user expectations at required cost. Cross-layer resilience techniques, implemented across multiple layers of the system stack and designed to work together, can help system designers build effective robust systems at the desired cost point. This paper brings to the forefront two major cross-layer resilience challenges: 1. Quantification and validation of the effectiveness of a cross-layer resilience approach to robust system design in overcoming hardware reliability challenges. 2. Global optimization of a robust system design using cross-layer resilience techniques.Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010; 01/2010
Conference Proceeding: Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges.[show abstract] [hide abstract]
ABSTRACT: Future system design methodologies must accept the fact that the underlying hardware will be imperfect, and enable design of robust systems that are resilient to hardware imperfections. Three techniques that can enable a sea change in robust system design are: 1. built-in soft error resilience (BISER), 2. circuit failure prediction, and 3. concurrent autonomous self-test using stored patterns (CASP). Global optimization across multiple abstraction layers is essential for cost-effective robust system design using these techniques.Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008; 01/2008
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