Conference Proceeding

Cross-layer error resilience for robust systems

Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers 12/2010; DOI:10.1109/ICCAD.2010.5654129 pp.177 - 180 In proceeding of: Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Source: IEEE Xplore

ABSTRACT A large class of robust electronic systems of the future must be designed to perform correctly despite hardware failures. In contrast, today's mainstream systems typically assume error-free hardware. Classical fault-tolerant computing techniques are too expensive for this purpose. This paper presents an overview of new techniques that can enable a sea change in the design of cost-effective robust systems. These techniques utilize globally-optimized cross-layer approaches, i.e., across device, circuit, architecture, runtime, and application layers, to overcome hardware failures.

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Keywords

Classical fault-tolerant
 
cost-effective robust systems
 
large class
 
overview
 
paper presents
 
robust electronic systems
 
sea change
 
techniques utilize globally-optimized cross-layer approaches
 
today's mainstream systems