Article

Heavy Ion Testing With Iron at 1 GeV/amu

GSFC, Radiat. Effects & Anal. Group, NASA, Greenbelt, MD, USA
IEEE Transactions on Nuclear Science (impact factor: 1.45). 11/2010; DOI:10.1109/TNS.2010.2066575 pp.2948 - 2954
Source: IEEE Xplore

ABSTRACT A 1 GeV/amu 56Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends at the GCR flux energy peak. Three SRAMs and an SRAM-based FPGA evaluated at the NASA Space Radiation Effects Laboratory demonstrate that a 90° tilt irradiation yields a unique device response. These tilt angle effects need to be screened for, and if found, pursued with radiation transport simulations to quantify their impact on event rate calculations.

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Keywords

90° tilt irradiation yields
 
GCR flux energy peak
 
NASA Space Radiation Effects Laboratory
 
SRAM-based FPGA
 
tilt angle effects
 
true 90° tilt irradiations
 
various microelectronic components
 

J.A. Pellish