Article
Development of a Versatile Test Platform for Single Event Effect (SEE) Characterization of Analog, Digital and Mixed-Signals Integrated Circuits (ICs)
Space Technol., Canadian Space Agency, Longueuil, QC, Canada
IEEE Transactions on Nuclear Science (impact factor:
1.45).
01/2010;
DOI:10.1109/TNS.2009.2032864
pp.3341 - 3346
Source: IEEE Xplore
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Keywords
Analog Multitrig Unit
Canadian Space Agency
configurable Digital Comparator
electronic devices