Processing and properties of ytterbium-erbium silicate thin film gain media
ABSTRACT The structural and photoluminescence properties of ytterbium-erbium silicate thin films have been investigated. The films were fabricated by RF-magnetron co-sputtering of Er2O3, Yb2O3 and SiO2 on c-Si and subsequent annealing in N2 or O2 atmosphere.
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ABSTRACT: The photoluminescence (PL) and decay time at 1.53μm of sputtered Er0.2Re1.8Si2O7 (Re=Yb, Y) thin films were investigated. The enhancement of the PL at 974nm pumping in the Er0.2Yb1.8Si2O7 film was demonstrated compared with Er0.2Y1.8Si2O7 film.01/2011;