A perfect crystal X-ray analyser with meV energy resolution
ABSTRACT We present a new method to construct a spherical crystal X-ray energy analyser. The energy analysis is based on high order Bragg reflections from a silicon perfect crystal at angles very close to 90°. In order to preserve the perfect crystal properties in a focusing optics, necessary for meV energy resolution and large angular acceptance, we developed a procedure to mount ≈12 000 small crystals, obtained from the same silicon wafer, on a spherical substrate. The method is based on computer controlled glueing and cycles of etching for each crystal. We obtained analysers with an energy resolution of 1.7±0.5 meV for 21.75 keV X-rays, using the Si(11 11 11) reflection, and with 25 mrad2 angular acceptance. These analysers have been specifically developed for high energy resolution inelastic X-ray scattering.
SourceAvailable from: Paolo Ghigna[Show abstract] [Hide abstract]
ABSTRACT: Inelastic x-ray scattering (IXS) with very high (meV) energy resolution has become a valuable spectroscopic tool, complementing the well established coherent inelastic neutron scattering (INS) technique for phonon dispersion investigations. In the study of crystalline systems IXS is a viable alternative to INS, especially in cases where only small samples are available. Using IXS, we have measured the phonon dispersion of Nd1.86Ce0.14CuO4 + δ along the [ξ, 0, 0] and [ξ, ξ, 0] in-plane directions. Compared to the undoped parent compound, the two highest longitudinal optical (LO) phonon branches are shifted to lower energies because of Coulomb-screening effects brought about by the doped charge carriers. An additional anomalous softening of the highest branch is observed around q = (0.2, 0, 0). This anomalous softening, akin to what has been observed in other compounds, provides evidence for a strong electron-phonon coupling in the electron-doped high-temperature superconductors.International Journal of Modern Physics B 01/2012; 17(04n06). DOI:10.1142/S0217979203016133 · 0.46 Impact Factor
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ABSTRACT: Multilayers are becoming an increasingly important tool in X-ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel-type configuration for use as an X-ray collimating device are provided. The results of X-ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X-ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra-high-resolution inelastic X-ray scattering spectrometer at the Advanced Photon Source.Journal of Synchrotron Radiation 01/2014; 21(Pt 1):16-23. DOI:10.1107/S1600577513024077 · 3.02 Impact Factor
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ABSTRACT: The sound attenuation in the THz region is studied down to T=16 K in glassy glycerol by inelastic x-ray scattering. At striking variance with the decrease found below 100 K in the GHz data, the attenuation in the THz range does not show any T dependence. This result i) indicates the presence of two different attenuation mechanisms, active respectively in the high and low frequency limits; ii) demonstrates the non-dynamic origin of the attenuation of THz sound waves, and confirms a similar conclusion obtained in SiO2 glass by molecular dynamics; and iii) supports the low frequency attenuation mechanism proposed by Fabian and Allen (Phys.Rev.Lett. 82, 1478 (1999)).