Article
Electronic radon monitoring with the CMOS System-on-Chip AlphaRad
Institut Pluridisciplinaire Hubert Curien (IPHC) UMR 7500 CNRS/IN2P3, 23 rue du Lœss, BP 28, F-67037 Strasbourg Cedex 2, France; Institut de Radioprotection et de Sûreté Nucléaire (IRSN, DSU-SERAC-LPMA), BP 68, 91192 Gif-sur-Yvette Cedex, France
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:10.1016/j.nima.2007.10.034
pp.412-417
-
Citations (0)
-
Cited In (0)
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed.
The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual
current impact factor.
Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence
agreement may be applicable.
Keywords
AlphaRad chip
CMOS pixel sensor
complete electronic board
complete system
data treatment
electronic board
electronic monitoring
excellent linearity
first measurement
future electronic radon
future ERM
independent AlphaRad chips
inexpensive
integrated circuit AlphaRad
maximal
new System-on-Chip
numeric block
promising applications
small printed-circuit board
Xilinx programmable gate array