Article

Improved Bayesian image denoising based on wavelets with applications to electron microscopy

Dept. Sistemas Electrónicos y de Telecomunicación, Escuela Politécnica Superior, Univ. San Pablo-CEU, Urb. Montepríncipe s/n, Boadilla del Monte, 28668 Madrid, Spain; Biocomputing Unit, National Center of Biotechnology (CSIC), Campus Univ. Autónoma s/n, 28049 Madrid, Spain; Dept. Matemática e Informática Aplicadas a la Ingeniería Civil, E.T.S. Ingenieros de Caminos, Univ. Politécnicade Madrid, Ciudad Universitaria s/n, 28040 Madrid, Spain; Dept. Matemática Aplicada, E.T.S. Ingeniería, Univ. Pontificia Comillas, c/Alberto Aguilera, 23, 28015 Madrid, Spain
Pattern Recognition 01/2006; DOI:10.1016/j.patcog.2005.12.009
Source: DBLP

ABSTRACT In this work we discuss an improvement of the image-denoising wavelet-based method presented by Bijaoui [Wavelets, Gaussian mixtures and Wiener filtering, Signal Process. 82 (2002) 709–712]. We show that the parameter estimation step can be replaced by a constrained nonlinear optimization. We propose three different methods to estimate the parameters. As in Bijaoui's original article, two of them deal with white noise. We show that the resulting algorithms improve the one originally proposed. Our third method extends the applicability of the denoising algorithm to colored noise. We test our algorithms with images simulating electron microscopy (EM) conditions as well as experimental EM images.

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Keywords

algorithms
 
Bijaoui [Wavelets
 
Bijaoui's original article
 
colored noise
 
constrained nonlinear optimization
 
images simulating electron microscopy
 
parameter estimation step
 
resulting algorithms
 
Signal Process
 
white noise