Article
Improved Bayesian image denoising based on wavelets with applications to electron microscopy
Dept. Sistemas Electrónicos y de Telecomunicación, Escuela Politécnica Superior, Univ. San Pablo-CEU, Urb. Montepríncipe s/n, Boadilla del Monte, 28668 Madrid, Spain; Biocomputing Unit, National Center of Biotechnology (CSIC), Campus Univ. Autónoma s/n, 28049 Madrid, Spain; Dept. Matemática e Informática Aplicadas a la Ingeniería Civil, E.T.S. Ingenieros de Caminos, Univ. Politécnicade Madrid, Ciudad Universitaria s/n, 28040 Madrid, Spain; Dept. Matemática Aplicada, E.T.S. Ingeniería, Univ. Pontificia Comillas, c/Alberto Aguilera, 23, 28015 Madrid, Spain
Pattern Recognition
01/2006;
DOI:10.1016/j.patcog.2005.12.009
Source: DBLP
- Citations (11)
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Cited In (0)
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Article: Wavelet Thresholding via a Bayesian Approach
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ABSTRACT: We discuss a Bayesian formalism which gives rise to a type of wavelet threshold estimation in non-parametric regression. A prior distribution is imposed on the wavelet coe#cients of the unknown response function, designed to capture the sparseness of wavelet expansion common to most applications. For the prior speci#ed, the posterior median yields a thresholding procedure. Our prior model for the underlying function can be adjusted to give functions falling in any speci#c Besov space. We establish a relation between the hyperparameters of the prior model and the parameters of those Besov spaces within which realizations from the prior will fall. Such a relation gives insightinto the meaning of the Besov space parameters. Moreover, the established relation makes it possible in principle to incorporate prior knowledge about the function's regularity properties into the prior model for its wavelet coe#cients. However, prior knowledge about a function's regularity properties might be hard ...08/1999; -
Article: Spatially adaptive wavelet thresholding with context modeling for image denoising.
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ABSTRACT: The method of wavelet thresholding for removing noise, or denoising, has been researched extensively due to its effectiveness and simplicity. Much of the literature has focused on developing the best uniform threshold or best basis selection. However, not much has been done to make the threshold values adaptive to the spatially changing statistics of images. Such adaptivity can improve the wavelet thresholding performance because it allows additional local information of the image (such as the identification of smooth or edge regions) to be incorporated into the algorithm. This work proposes a spatially adaptive wavelet thresholding method based on context modeling, a common technique used in image compression to adapt the coder to changing image characteristics. Each wavelet coefficient is modeled as a random variable of a generalized Gaussian distribution with an unknown parameter. Context modeling is used to estimate the parameter for each coefficient, which is then used to adapt the thresholding strategy. This spatially adaptive thresholding is extended to the overcomplete wavelet expansion, which yields better results than the orthogonal transform. Experimental results show that spatially adaptive wavelet thresholding yields significantly superior image quality and lower MSE than the best uniform thresholding with the original image assumed known.IEEE Transactions on Image Processing 02/2000; 9(9):1522-31. · 3.04 Impact Factor -
Article: Image denoising using scale mixtures of Gaussians in the wavelet domain.
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ABSTRACT: We describe a method for removing noise from digital images, based on a statistical model of the coefficients of an overcomplete multiscale oriented basis. Neighborhoods of coefficients at adjacent positions and scales are modeled as the product of two independent random variables: a Gaussian vector and a hidden positive scalar multiplier. The latter modulates the local variance of the coefficients in the neighborhood, and is thus able to account for the empirically observed correlation between the coefficient amplitudes. Under this model, the Bayesian least squares estimate of each coefficient reduces to a weighted average of the local linear estimates over all possible values of the hidden multiplier variable. We demonstrate through simulations with images contaminated by additive white Gaussian noise that the performance of this method substantially surpasses that of previously published methods, both visually and in terms of mean squared error.IEEE Transactions on Image Processing 02/2003; 12(11):1338-51. · 3.04 Impact Factor
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Keywords
algorithms
Bijaoui [Wavelets
Bijaoui's original article
colored noise
constrained nonlinear optimization
images simulating electron microscopy
parameter estimation step
resulting algorithms
Signal Process
white noise