Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.
DOI: 10.1109/IOLTS.2010.5560220 Conference: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece
ABSTRACT In this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits.
Full-textDOI: · Available from: Diego Mateo, May 29, 2015
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Conference Paper: Frequency characterization of a 2.4 GHz CMOS LNA by thermal measurements[Show abstract] [Hide abstract]
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