Conference Paper

An I-IP based approach for the monitoring of NBTI effects in SoCs.

DOI: 10.1109/IOLTS.2009.5195977 Conference: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal
Source: DBLP

ABSTRACT In this paper we present a design for reliability methodology, with the goal of reducing the impact of transistor VTH degradation due for example to phenomena such as NBTI. It uses infrastructure IPs (I-IPs) featuring a self compensation scheme that automatically detects transistor aging effects and illustrates the design for test infrastructure used to make the SoC/System aware of the NBTI effects. This scheme is conceptually validated by using multi-level simulation and models. The discussion of possible exploitation models completes the paper.

  • Source
    [Show abstract] [Hide abstract]
    ABSTRACT: This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200 K to 800 K gates, pose significant challenges to logic BIST methodology, flow, and tools. The paper presents the process of generating a BIST-compliant core along with the logic BIST controller for at-speed testing. Comparative data on fault grades and area overhead between automatic test pattern generation (ATPG) and logic BIST are reported. The experimental results demonstrate that with automation of the proposed solutions, logic BIST can achieve test quality approaching that of ATPG with minimal area overhead and few changes to the design flow
    Test Conference, 1999. Proceedings. International; 02/1999
  • [Show abstract] [Hide abstract]
    ABSTRACT: The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault diagnosis is an integral part of the industrial effort towards these goals. This paper presents a novel cost-effective approach to the construction of diagnostic software-based test sets for microprocessors. The methodology exploits an existing post-production test set, designed for software-based self-test, and an already developed infrastructure IP to perform the diagnosis. An initial diagnostic test set is built, and then iteratively refined resorting to an evolutionary method. Experimental results are reported in the paper showing the feasibility and effectiveness of the approach for an Intel i8051 processor core.
  • Source
    [Show abstract] [Hide abstract]
    ABSTRACT: Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the degradation of NBTI in both static and dynamic operations. Model scalability and generality are comprehensively verified with experimental data over a wide range of process and bias conditions. By implementing the new model into SPICE for an industrial 90nm technology, key insights are obtained for the development of robust design solutions: (1) the most effective techniques to mitigate the NBTI degradation are VDD tuning, PMOS sizing, and reducing the duty cycle; (2) an optimal VDD exists to minimize the degradation of circuit performance; (3) tuning gate length or the switching frequency has little impact on the NBTI effect; (4) a new switching scenario is identified for worst case timing analysis during NBTI stress.
    Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006; 01/2006