Conference Paper

A low-cost concurrent error detection technique for processor control logic.

DOI: 10.1145/1403375.1403592 Conference: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008
Source: DBLP

ABSTRACT This paper presents a concurrent error detection technique targeted towards control logic in a processor with emphasis on low area overhead. Rather than detect all modeled transient faults, the technique selects faults which have a high probability of causing damage to the architectural state of the processor and protects the circuit against these faults. Fault detection is achieved through a series of assertions. Each assertion is an implication from inputs to the outputs of a combinational circuit. Fault simulation experiments performed on control logic modules of an industrial processor suggest that high reduction in damage causing faults can be achieved with a low overhead.

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Jun 10, 2014