Conference Proceeding

Maximum circuit activity estimation using pseudo-boolean satisfiability.

01/2007; pp.1538-1543 In proceeding of: 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France
Source: DBLP
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    Article: Effects of Delay Models on Peak Power Estimation of VLSI Sequential Circuits
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    ABSTRACT: Previous work has shown that maximum switching density at a given node is extremely sensitive to a slight change in the delay at that node. However, when estimating the peak power for the entire circuit, the powers estimated must not be as sensitive to a slight variation or inaccuracy in the assumed gate delays because computing the exact gate delays for every gate in the circuit during simulation is expensive. Thus, we would like to use the simplest delay model possible to reduce the execution time for estimating power, while making sure that it provides an accurate estimate, i.e., that the peak powers estimated will not vary due to a variation in the gate delays. Results for four delay models are reported for the ISCAS85 combinational benchmark circuits, ISCAS89 sequential benchmark circuits, and several synthesized circuits.
    04/2002;
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    Article: Peak Power Estimation Using Genetic Spot Optimization for Large VLSI Circuits
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    ABSTRACT: Estimating peak power involves optimization of the circuit's switching function. We propose genetic spot expansion and optimization in this paper to estimate tight peak power bounds for large sequential circuits. The optimization spot shifts and expands dynamically based on the maximum power potential (MPP) of the nodes under optimization. Four genetic spot optimization heuristics are studied for sequential circuits. Experimental results showed an average of 70.7% tighter peak power bounds for large sequential benchmark circuits was achieved in short execution times.
    04/2002;
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    Article: Estimation of peak power dissipation in VLSI circuits using the limiting distributions of extreme order statistics
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    ABSTRACT: In this paper, we present a statistical method for estimating the peak power dissipation in very large scale integrated (VLSI) circuits. The method is based on the theory of extreme order statistics and its application to the probabilistic distributions of the cycle-by-cycle power consumption, the maximum-likelihood estimation, and the Monte-Carlo simulation. It enables us to predict the maximum power of a VLSI circuit in the set of constrained input vector pairs as well as the complete set of all possible input vector pairs. The simulation-based nature of the proposed method allows us to avoid the limitations of a gate-level delay model and a gate-level circuit structure. Most significantly, the proposed method produces maximum power estimates to satisfy user-specified error and confidence levels. Experimental results show that this method typically produces maximum power estimates within 5% of the actual value and with a 90% confidence level by only simulating less than 2500 input vectors
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 09/2001; · 1.27 Impact Factor

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