Conference Proceeding
Chip Level Statistical Leakage Power Estimation Using Generalized Extreme Value Distribution.
01/2011;
pp.173-179 In proceeding of: Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation - 21st International Workshop, PATMOS 2011, Madrid, Spain, September 26-29, 2011. Proceedings
Source: DBLP
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