Conference Proceeding

NAND flash testing: A preliminary study on actual defects.

Lab. d'Inf., de Robot. et de Microelectron. de Montpellier, Univ. Montpellier 2, Montpellier, France
01/2009; DOI:10.1109/TEST.2009.5355898 pp.1 In proceeding of: 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009
Source: DBLP

ABSTRACT Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.

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