Article
DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs.
IEEE Trans. on CAD of Integrated Circuits and Systems
01/2010;
29:1628-1639.
pp.1628-1639
Source: DBLP
-
Citations (0)
-
Cited In (0)
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed.
The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual
current impact factor.
Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence
agreement may be applicable.