X-Ray Diffraction (XRD) Residual Stress Measurement: Theory and Application on Field

Luca.G. Bochese, Daniele Maestrini, Paolo Marconi

Journal Article: ISPEMI 7th International Symposium on Precision Engineering Measurement and Instrumentation 01/2011;

Abstract

XRD technique for residual stress measurement is a technique still known and used in university laboratories. Recently it has been possible to perform those measurement also on-the-field, thanks to a new generation of XRD portable diffrattometers. After a brief introduction to XRD theory, the paper presents a recent on-the-field application on a welded petrochemical reactor.

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