Article

Critical Current Density of YBa{2}Cu{3}O{7-d} Low-Angle Grain Boundaries in Self-Field

02/2001; DOI:doi:10.1063/1.1360230
Source: arXiv

ABSTRACT A study has been perfomed on the superconducting critical current density J_{c} flowing across low angle grain boundaries in epitaxial thin films of YBa{2}Cu{3}O{7-d} (YBCO). The materials studied were dual grain boundary rings deposited on SrTiO{3} and containing 2, 3, 5 and 7 degree tilt boundaries. The current density in self-field was determined by magnetometric methods at temperatures from 5 K to T_c. We conclude that at the higher temperatures of coated conductor applications, there is limited potential for improving J_{c} by reducing the grain boundary angle below about 3 degrees. Comment: 10 pp. total, including REVTEX text, 1 table, and 3 figures

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    Article: The distribution of transport current in YBCO coated conductor with zipper striations
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    ABSTRACT: An YBCO coated conductor with a zipper pattern striation is investigated by scanning laser microscopy (SLM). The distribution of transport current deduced from the VTSLM images shows that striations act as artificial barriers forcing the current to flow around them. Current sharing and redistribution are observed at the zipper area. We find the major dissipation mechanism in the sample in the superconducting state to be the current crowding at bottleneck areas. The bottleneck seems to be caused by the disabled filaments at and around the zipper area. Some filaments show the dissipation away from the zipper area. In general, we find that the lower J<sub>c</sub><sup>*</sup> areas have lower T<sub>c</sub><sup>*</sup> and high δV<sub>m</sub>, which we consider as a sign of the current crowding. For the first time, we have demonstrated that there is a high temperature signature of the lower J<sub>c</sub><sup>*</sup> (high dissipation) area and VTSLM can detect the signature.
    IEEE Transactions on Appiled Superconductivity 07/2005; · 1.04 Impact Factor
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    Article: Transverse compressive stress effect in Y-Ba-Cu-O coatings on biaxially textured Ni and Ni-W substrates
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    ABSTRACT: Electromechanical properties of yttrium-barium-copper-oxide (YBCO) coatings on both pure Ni and Ni-5at.%W alloy rolling-assisted, biaxially-textured substrates (RABiTS) were investigated. The effect of transverse compressive stress on transport critical-current densities (J<sub>c</sub>) was measured on samples at 76 K and self magnetic field. Transverse compressive stress can significantly degrade J<sub>c</sub> in YBCO deposited on pure Ni RABiTS unless sufficient frictional support is provided to the sample or the substrate is given a work-hardening treatment. On the other hand, results obtained for YBCO on Ni-5at.%W alloy RABiTS show that the tolerance to transverse stress of these conductors is significantly improved. These electromechanical properties are interpreted with scanning-electron micrographs of the microstructure of the samples after electromechanical testing, as well as stress-strain characteristics measured on RABiTS substrates at 76 K. The tensile yield strength, Young's modulus, and proportional limit of elasticity of candidate RABiTS substrate materials are tabulated and compared.
    IEEE Transactions on Appiled Superconductivity 07/2003; · 1.04 Impact Factor
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    Article: Transverse compressive stress effect in Y-Ba-Cu-O coatings on biaxially textured Ni and Ni-W substrates
    [show abstract] [hide abstract]
    ABSTRACT: Electromechanical properties of yttrium-barium-copper-oxide (YBCO) coatings on both pure Ni and Ni-5at.%W alloy rolling-assisted, biaxially-textured substrates (RABiTS) were investigated. The effect of transverse compressive stress on transport critical-current densities () was measured on samples at 76 K and self magnetic field. Transverse compressive stress can significantly degrade in YBCO deposited on pure Ni RABiTS unless sufficient frictional support is provided to the sample or the substrate is given a work-hardening treatment. On the other hand, results obtained for YBCO on Ni-5at.%W alloy RABiTS show that the tolerance to transverse stress of these conductors is significantly improved. These electromechanical properties are interpreted with scanning-electron micrographs of the microstructure of the samples after electromechanical testing, as well as stress-strain characteristics measured on RABiTS substrates at 76 K. The tensile yield strength, Young's modulus, and proportional limit of elasticity of candidate RABiTS substrate materials are tabulated and compared.
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY. 01/2003; 13.

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Keywords

1 table
 
3 degrees
 
7 degree tilt boundaries
 
conductor applications
 
epitaxial thin films
 
higher temperatures
 
low angle grain boundaries
 
REVTEX text
 
superconducting critical current density J_{c}
 
temperatures