Application of X-ray fluorescence spectrometry in multielement analysis of rubber samples.
ABSTRACT Elemental analysis of rubber samples is rather difficult, but XRF spectrometry offers some advantages relative to other more popular chemical instrumental techniques due to relatively simple sample preparation. For the excitation annular radionuclide photon sources of 55Fe and 109Cd were used. The analyses of metal content in samples of natural latex have been performed in order to investigate the relation between the low specific resistivity of the latex and the respective metal content. The results are presented and discussed.
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ABSTRACT: Pyrochlore ore samples from an albite–riebeckite granite were separated with heavy liquids and analyzed by energy‐dispersive x‐ray fluorescence (EDXRF), using the emission–transmission (E–T) method of quantification. Ti, Mn, Fe, Zn, Y, Zr, Nb, Sn, Ta, W, Pb, Th, and U were evaluated in the ore. The multielement and reproducible nature of the technique is advantageous, as it makes it possible to simultaneously evaluate Nb, Sn, Ta, Th, and U, which are the elements of economic interest. The average concentrations of Nb, Ta, Th, and U are 16.22, 1.81, 1.85, and 2.24 wt%, respectively; this makes the ore of economic importance if the processing is workable economically.Instrumentation Science & Technology - INSTRUM SCI TECHNOL. 08/2007; 32(5):529-536.
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ABSTRACT: X-ray fluorescence spectrometry due to its nondestructive nature is widely applied in analysis of single layers and multiple layer films (e.g. semiconductors, electrooptic and solar cell devices, coatings, corrosion and paint layers), individual particles (airborne, fly ash, gunshot residue particles, etc.), art and archeological objects (manuscripts, paintings, icons) and many others. Quantitative analysis of these materials, frequently classified as samples of less than infinite thickness (thin or intermediate-thickness samples), required applying adequate matrix correction methods taking into account complex dependence of analyte fluorescent radiation intensity on full matrix composition and sample thickness. In this article, the matrix correction methods including fundamental parameters, Monte Carlo simulations, influence coefficients algorithms and methods based on X-ray transmission measurements are reviewed.The difficulties in the analysis of single layer and multiple layer films and the accuracy of fundamental parameter methods in simultaneous determination of their thickness and composition are discussed. The quantitative analysis of individual particles and inhomogeneous and/or complex structure materials using fundamental parameter and Monte Carlo simulation methods in micro-beam X-ray fluorescence spectrometry are also reviewed. Some references are devoted to the analysis of light matrix samples, e.g. geological, environmental and biological samples, in which undetectable low-Z elements are present (so-called ‘dark matrix’) using backscattered fundamental parameter methods.Since the samples of less than infinite thickness are partially transparent for X-ray beams, the transmission measurements present possibilities that are unattainable for bulk samples. Thus, the emission–transmission method and also new instruments allowing measurements of the primary X-ray beam transmitted through the sample together with measurements of X-ray fluorescence intensities in transmission and reflection geometry are reviewed.Spectrochimica Acta Part B: Atomic Spectroscopy. 01/2009;